Vega - AFM Automatizat
Ultimate imaging quality with buildin acoustic and vibration isolation, active thermostabilization, industry lowest 25 fm/√Hz optical beam deflection sensor noise and unique design of scanningbytip system allow routine high resolution imaging.
Equipped with 50+ AFM modes including HybriD mode all cuttingedge nanomechanical, electrical and magnetic studies are available in basic configuration.
Automated study of samples arrays by userdefined scenario with database image storage.
Up to 200×200 mm and 40 mm in height samples inspection in any point with 1 μm positioning accuracy.
Smart ScanT™ software for oneclick optimization of scanning parameters. This is not just an algorithm, it is rather a unique companion that helps a newcomers in AFM to get industry quality images and assists the experts.
Wide possibilities of customization integration of addition optical equipment
Type:tube scanner with closed loop sensors. Scanning by tip
Scanning range, XYZ:100×100×10 µm or 2×2×1 µm in Low Voltage Mode
Tip-Sample Positioning Type:motorized sample positioning in XYZ
XYZ thermal drift:Less than 0.2 nm/min
Moving range:200×200 mm in XY, 30 mm in Z
Positioning accuracy:1 µm in XY, 0.2 µm in Z
Positioning speed:8 mm/sec in XY
Approach:smart soft approach algorithm
Optical beam deflection sensor noise:<25 fm/√Hz above 50 kHz
Resolution:0,98 μm
Field of view:up to 1.2×0.8 mm (5 Mpixel)
Autofocus:on cantilever, on sample
AFM probes:probe holder supports most commercially available probes
Number of scan channels:up to 24
Signal processing:512 Mb buffer Size, 3x 340 MHz FPGA, 320 MHz DSP
Lock-in amplifiers:2x analog lock-in amplifiers, 3x digital lock-in amplifiers (Multifrequency AFM modes supporting)
Generators:6x 32 bit digital generators, 4x for Lock-in
Self-testing:automated performance check
Scanning parameters auto adjustment:drive amplitude, lock-in gain, setpoint, feedback gain, scanning rate
Programming tools:Nova PowerScript language, LabView integration, Database integration
PC interface:USB
Temperature stabilization:build-in fan free thermal stabilization with 0.05 °C accuracy
Acoustic isolation:build-in acoustic enclosure
Vibration isolation:build-in active vibration isolation table
Nanolithography:Voltage, Current, Force (All Vector and Raster)
Spectroscopy:Force-, Amplitude-, Phase-, Frequency-, Current-Distance, I(V), Piezopulse, Custom mode
Dimensions:W×L×H; 810×610×1450 mm